Interference diagnostics large-scale surfaces

O. V. Angelsky; O. P. Maksimyak; P. P. Maksimyak

doi:10.1117/12.741921

8 May 2007 Interference diagnostics large-scale surfaces

O. V. Angelsky, O. P. Maksimyak, P. P. Maksimyak

Proceedings Volume 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III; 66350T (2007) https://doi.org/10.1117/12.741921
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 2006, Bucharest, Romania

Abstract

The feasibilities for optical correlation diagnostics of a rough surface with large surface inhjmogeneities by determining the transformations of the longitudinal coherence function of the field scattered by such surface are substantiated and implemented.

Citation Download Citation

O. V. Angelsky, O. P. Maksimyak, and P. P. Maksimyak "Interference diagnostics large-scale surfaces", Proc. SPIE 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 66350T (8 May 2007); https://doi.org/10.1117/12.741921

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available