Real-Time Snapshot Interferometer

Joseph L McLaughlin; Bruce A Horwitz

doi:10.1117/12.939589

23 March 1987 Real-Time Snapshot Interferometer

Joseph L McLaughlin, Bruce A Horwitz

Author Affiliations +

Proceedings Volume 0680, Surface Characterization and Testing; (1987) https://doi.org/10.1117/12.939589
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

A compact, no-moving-parts, dc-phase-measuring interferometer has been designed and manufactured. This interferometer was designed to provide high-density sampling, high-accuracy wavefront measurements under adverse conditions. A crossed grating shearing interferometer technique has been utilized where all data is simultaneously collected on a single fixed detector array. This highly stable configuration provides a means of obtaining phase information using cw, shuttered (1 to 10-3 sec), or ultra-short-pulsed sources. This self-contained instrument can be used to take large numbers of interferograms quickly and reduce their data efficiently to obtain wavefront constructions.

Citation Download Citation

Joseph L McLaughlin and Bruce A Horwitz "Real-Time Snapshot Interferometer", Proc. SPIE 0680, Surface Characterization and Testing, (23 March 1987); https://doi.org/10.1117/12.939589

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