Paper
28 December 2007 Statistical method of evaluation of flip-flop dynamical parameters
P. Z. Wieczorek, L. J. Opalski
Author Affiliations +
Proceedings Volume 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007; 693713 (2007) https://doi.org/10.1117/12.784669
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 2007, Wilga, Poland
Abstract
This paper presents statistical algorithm and measurement system for precise evaluation of flip-flop dynamical parameters in asynchronous operation. The analyzed flip-flop parameters are failure probability, MTBF and propagation delay. It is shown how these parameters depend on metastable operation of flip-flops. The numerical and hardware solutions shown in article allow for precise and reliable comparison of flip-flops. Also the analysis of influence of flip-flop electrical parameters of flip-flop electrical parameters on their metastable operation is possible with use of presented statistical method. Statistical estimation of parameters of flip-flops in which metastability occurs, seems to be more reliable than standard empirical methods of flip-flop analysis. Presented method allows for showing inaccuracies in theoretical model of metastability.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Z. Wieczorek and L. J. Opalski "Statistical method of evaluation of flip-flop dynamical parameters", Proc. SPIE 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 693713 (28 December 2007); https://doi.org/10.1117/12.784669
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KEYWORDS
Picosecond phenomena

Statistical analysis

Statistical methods

Failure analysis

Remote sensing

Telescopic pixel displays

Voltage controlled current source

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