Photothermal common-path interferometry (PCI): new developments

A. Alexandrovski; Martin Fejer; A. Markosian; Roger Route

doi:10.1117/12.814813

28 February 2009 Photothermal common-path interferometry (PCI): new developments

A. Alexandrovski, Martin Fejer, A. Markosian, Roger Route

Proceedings Volume 7193, Solid State Lasers XVIII: Technology and Devices; 71930D (2009) https://doi.org/10.1117/12.814813
Event: SPIE LASE: Lasers and Applications in Science and Engineering, 2009, San Jose, California, United States

Abstract

The PCI technique, a modification of photothermal spectroscopy, has become a powerful tool for testing various low absorptive optical materials and components. The current state of the technique and recent progress in extending its capabilities toward the mid-infrared region is presented. A 3.39 μm probe was used for testing and studying various semiconductor materials, such as p-doped GaAs, that can exhibit non-thermal response to the pump beam in addition to the thermal one. A simple theoretical model of the PCI method is shown to describe adequately the experimental data, making it possible to calibrate the setup without using a calibration standard.

Citation Download Citation

A. Alexandrovski, Martin Fejer, A. Markosian, and Roger Route "Photothermal common-path interferometry (PCI): new developments", Proc. SPIE 7193, Solid State Lasers XVIII: Technology and Devices, 71930D (28 February 2009); https://doi.org/10.1117/12.814813

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