Paper
20 May 2009 Dynamic analysis of wiresaw slicing brittle crystals
Tao Sun, Yanbo Feng
Author Affiliations +
Proceedings Volume 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 72823V (2009) https://doi.org/10.1117/12.831074
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China
Abstract
In the past few years, wire sawing was developed quickly and became the promising brittle crystals slicing technology because of its advantages of processing large wafers of very small thickness, high surface quality, high yield, and ability to slice brittle crystals made of various materials. In the process, the thin wire, the processing tools, travels at high speed, and subjects to external excitation from many aspects. Dynamic effect is directly related to processing result, in this paper the dynamic effect of wiresaw in cutting region is studied, a suitable model can be present according to continuous gyroscopic system character. Research on wire oscillation form variation with the change of cutting depth; obtain the steady state response of wire with different process parameters on wire saw manufacturing process, and a better understanding of the wire saw operation can be developed. The effect the final surface finish of wafers is analyzed to improve the process quality.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tao Sun and Yanbo Feng "Dynamic analysis of wiresaw slicing brittle crystals", Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 72823V (20 May 2009); https://doi.org/10.1117/12.831074
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KEYWORDS
Crystals

Radon

Semiconducting wafers

Abrasives

Surface finishing

Manufacturing

Modal analysis

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