Uniting IR detectors for tactical and space applications: a continuous cycle for reliability

Xavier Breniere; Philippe Tribolet

doi:10.1117/12.819838

7 May 2009 Uniting IR detectors for tactical and space applications: a continuous cycle for reliability

Xavier Breniere, Philippe Tribolet

Proceedings Volume 7298, Infrared Technology and Applications XXXV; 72981V (2009) https://doi.org/10.1117/12.819838
Event: SPIE Defense, Security, and Sensing, 2009, Orlando, Florida, United States

Abstract

Sofradir IR detectors are being deployed in a lengthening line of space applications (earth observation, atmospheric observation, scientific missions, etc...). At first glance, one may ask what do detectors for space applications have in common with detectors for tactical applications? On the one hand, space applications require far fewer quantities and IR detector reliability and electro-optical performances must be exceptionally high. Tactical applications, on the other hand, look to quantities in the thousands per year, delivered at low cost. As opposed to focusing on the differences, Sofradir is taking advantage of these two areas. Firstly, space applications are developing new advances and technologies that can later be introduced in the production of IR detectors for tactical applications, thereby increasing their quality and reliability. In addition, Sofradir can better satisfy space application requirements for failure rates, as these can only be demonstrated with the large number of detectors manufactured, which tactical applications provide. This advantage is only possible because the core of the technologies and manufacturing processes are common to both applications. As a result, this approach offers a continuous cycle for reliability of IR detectors, accelerating reliability growth in production, and at the same time meeting requirements for space applications.

Citation Download Citation

Xavier Breniere and Philippe Tribolet "Uniting IR detectors for tactical and space applications: a continuous cycle for reliability", Proc. SPIE 7298, Infrared Technology and Applications XXXV, 72981V (7 May 2009); https://doi.org/10.1117/12.819838

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