Zeroes of amplitude of s and p components of linearly polarized light at the reflection from a system 'thin dielectric film - absorbing basis'

M. Yu. Sakhnovskyj; B. M. Tymochko; V. M. Rudeichuk

doi:10.1117/12.853078

31 December 2009 Zeroes of amplitude of s and p components of linearly polarized light at the reflection from a system 'thin dielectric film - absorbing basis'

M. Yu. Sakhnovskyj, B. M. Tymochko, V. M. Rudeichuk

Author Affiliations +

Proceedings Volume 7388, Ninth International Conference on Correlation Optics; 738814 (2009) https://doi.org/10.1117/12.853078
Event: Correlation Optics 2009, 2009, Chernivsti, Ukraine

Abstract

The polarization properties of dielectric films on an absorbing substrate in a neighbourhood of bifurcation points are investigated. It is shown that polarimetric and ellipsometric measurements of optic-geometric parameters of film structures are most sensitive in the areas of a bifurcation.

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M. Yu. Sakhnovskyj, B. M. Tymochko, and V. M. Rudeichuk "Zeroes of amplitude of s and p components of linearly polarized light at the reflection from a system 'thin dielectric film - absorbing basis'", Proc. SPIE 7388, Ninth International Conference on Correlation Optics, 738814 (31 December 2009); https://doi.org/10.1117/12.853078

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