Paper
10 September 2009 Microscopic TV sherography for microsystems characterization
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Abstract
Microscopic TV holography (MTVH) is widely used for out-of-plane deformation and 3-D surface profile characterization of microsystems. However, the problem of overcrowding of fringes shows up when deformations are large, making quantitative fringe analysis difficult. In this paper, we introduce the use of microscopic TV sherography (MTVS) for microsystems characterization so that under relatively large out-of-plane deformation the slope of deformation is measured, rather than the deformation itself. The optical arrangement consists of a zoom imaging system with a conventional Michelson shear interferometer. We use the digital speckle photography (DSP) technique for precise measurement of magnitude of the lateral shear introduced between the two sheared images.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
U. Paul Kumar, N. Krishna Mohan, and M. P. Kothiyal "Microscopic TV sherography for microsystems characterization", Proc. SPIE 7432, Optical Inspection and Metrology for Non-Optics Industries, 74320T (10 September 2009); https://doi.org/10.1117/12.825766
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Cited by 3 scholarly publications.
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KEYWORDS
Digital signal processing

Speckle

Digital photography

Microsystems

Interferometers

Mirrors

Digital filtering

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