Performance of mode-biased wavefront sensor to detect multiple aberration modes

Changhai Liu; Zongfu Jiang; Shengyang Huang; Haotong Ma; Fengjie Xi

doi:10.1117/12.866939

11 October 2010 Performance of mode-biased wavefront sensor to detect multiple aberration modes

Changhai Liu, Zongfu Jiang, Shengyang Huang, Haotong Ma, Fengjie Xi

Proceedings Volume 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 76560M (2010) https://doi.org/10.1117/12.866939
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

We investigated the performance of mode-biased wavefront sensor(MWFS) to detect aberration including multiple modes. Two important parameters, Sensitivity and dynamic range, were chosen as criterions to evaluate the performance of the MWFS. We describe the tested wavefront as the superposition of several aberration modes, and considered it in three situations, in which the tested wavefront including: (a) only identical modes,(b) only relevant aberration modes,(c) only irrelevant aberration modes , relative to the biased ones. We show that the existence of the above three types of aberration modes in the tested wavefront greatly impacts the detection performance of the MWFS in terms of the sensitivity and dynamic range.

Citation Download Citation

Changhai Liu, Zongfu Jiang, Shengyang Huang, Haotong Ma, and Fengjie Xi "Performance of mode-biased wavefront sensor to detect multiple aberration modes", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76560M (11 October 2010); https://doi.org/10.1117/12.866939

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KEYWORDS

Sensors

Wavefront sensors

Wavefronts

Adaptive optics

Holography

Iris recognition

Signal detection

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