Microscale linear birefringence measurement

Qing-Lin Wu; Peng Hao; Shi-Yuan Duan; Zhang-Yuan Lei; Ke-Yi Wang

doi:10.1117/12.866718

11 October 2010 Microscale linear birefringence measurement

Qing-Lin Wu, Peng Hao, Shi-Yuan Duan, Zhang-Yuan Lei, Ke-Yi Wang

Proceedings Volume 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 76563A (2010) https://doi.org/10.1117/12.866718
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

A new method for linear birefringence measurement in micro-scale is presented. Mueller matrix is used to represent the anisotropy properties of sample, optical fiber probe of scanning optical near-field microscopy (SNOM) and other optical components. Two polarization modulators are used to complete the quantitative measurement. Firstly, the Mueller matrix of the probe is calculated by analyzing the output signal without sample. Together with the matrix of the probe, the elements of the Mueller matrix of sample could be calculated sequentially. The principle and realization method of the scheme for linear birefringence measurement are presented. The result shows that the dual-modulator-based system can separate the anisotropy of probe and sample, which could not be distinguished in the current scheme that using only one polarization modulator.

Citation Download Citation

Qing-Lin Wu, Peng Hao, Shi-Yuan Duan, Zhang-Yuan Lei, and Ke-Yi Wang "Microscale linear birefringence measurement", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76563A (11 October 2010); https://doi.org/10.1117/12.866718

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KEYWORDS

Near field scanning optical microscopy

Polarization

Birefringence

Modulators

Anisotropy

Modulation

Near field optics

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