Low IR input flux condition operations thanks to MCT e-APD

Frédéric Pistone; Philippe Tribolet; Gilbert Decaens; Sebastien Verdet; Johan Rothman; Eric De Borniol

doi:10.1117/12.850232

3 May 2010 Low IR input flux condition operations thanks to MCT e-APD

Frédéric Pistone, Philippe Tribolet, Gilbert Decaens, Sebastien Verdet, Johan Rothman, Eric De Borniol

Proceedings Volume 7660, Infrared Technology and Applications XXXVI; 76603B (2010) https://doi.org/10.1117/12.850232
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

Low IR input flux conditions are answering different system applications as gas detection needs, active imagery, very long ranges detection and identification and some scientific applications. Then for other applications like ground applications, some system design trade-off could be made between thermal performance and identification and equipment size and cost.

Citation Download Citation

Frédéric Pistone, Philippe Tribolet, Gilbert Decaens, Sebastien Verdet, Johan Rothman, and Eric De Borniol "Low IR input flux condition operations thanks to MCT e-APD", Proc. SPIE 7660, Infrared Technology and Applications XXXVI, 76603B (3 May 2010); https://doi.org/10.1117/12.850232

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