Paper
24 August 2010 Fast multi-spectral image registration based on a statistical learning technique
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Abstract
Statistical learning techniques have been used to dramatically speed-up keypoint matching and image registration. However, they are rarely applied to multi-spectral images. Statistical learning techniques regard various intensities as distinctive patterns. Thus, corresponding features extracted from multi-spectral images are recognized as different patterns, because the features have different intensity characteristics. In order to overcome this problem, we propose a novel statistical learning method that can be extended to multi-spectral images. The proposed approach obtains responses from multiple classifiers that are trained with well-registered multi-spectral images, in contrast to earlier approaches using one classifier. The responses of corresponding features can be similarly characterized as being of the same class even though the intensities of the corresponding features are quite different. The experimental results show that our method provides good performance on multi-spectral image registration compared to current methods.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Taeyoung Kim and Myungjin Choi "Fast multi-spectral image registration based on a statistical learning technique", Proc. SPIE 7810, Satellite Data Compression, Communications, and Processing VI, 78100C (24 August 2010); https://doi.org/10.1117/12.860437
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Image registration

Infrared imaging

Infrared radiation

Sensors

Thermography

Image processing

Image sensors

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