Red electroluminescence of diamond thin films

Xiaoping Wang; Yuzhuan Zhu; Xinxin Liu

doi:10.1117/12.888163

18 February 2011 Red electroluminescence of diamond thin films

Xiaoping Wang, Yuzhuan Zhu, Xinxin Liu

Proceedings Volume 7995, Seventh International Conference on Thin Film Physics and Applications; 79951K (2011) https://doi.org/10.1117/12.888163
Event: Seventh International Conference on Thin Film Physics and Applications, 2010, Shanghai, China

Abstract

A diamond/SiO2/ indium-tin oxide (ITO) thin film multilayer structure of electroluminescent devices was reported. Effects of process parameters on morphologies and structures of the thin films were detected and analyzed by scanning electron microscopy, X-ray diffraction (XRD) spectrometer and X-ray photoelectron spectrometer (XPS). Finally a strong monochromatic red light emission was observed from this multilayer structure device, the electroluminescence spectrum at room temperature shows that the only illumination peak locates at 742nm, which is attributed to silicon atoms within the diamond film impurity center.

Citation Download Citation

Xiaoping Wang, Yuzhuan Zhu, and Xinxin Liu "Red electroluminescence of diamond thin films", Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79951K (18 February 2011); https://doi.org/10.1117/12.888163

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