Paper
25 April 2012 Formation of PDMS films inside the holes of silica photonic crystal fibers
C. Markos, K. Vlachos, G. Kakarantzas
Author Affiliations +
Abstract
In this work, we demonstrate the formation of Poly-dimethylsiloxane (PDMS) films inside the holes of conventional silica photonic crystal fiber. The index guiding properties of the new PDMS-layer/Silica structures were investigated and optimized numerically using FDTD analysis. Films with thicknesses ranging from 100nm to 1μm were formed using different PDMS solution concentrations and different solution movement speeds. The thickness of films was very uniform along almost all the deposition length as indicated by Scanning Electron Microscopy (SEM) images and micro- Raman mapping.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Markos, K. Vlachos, and G. Kakarantzas "Formation of PDMS films inside the holes of silica photonic crystal fibers", Proc. SPIE 8426, Microstructured and Specialty Optical Fibres, 842604 (25 April 2012); https://doi.org/10.1117/12.922682
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Silica

Scanning electron microscopy

Photonic crystal fibers

Birefringence

Micro raman spectroscopy

Polarization

Liquids

Back to Top