Paper
10 April 2013 Simultaneous measurement of longitudinal and lateral piezoelectric strain coefficients using digital image correlation
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Abstract
Here, Digital image correlation (DIC) is demonstrated to be an accurate tool for the noncontact, non-destructive and rapid characterization of the converse piezoelectric effect in bulk and thin films. The out-of-plane (d33) and in-plane (d31) piezoelectric strain coupling coefficients of PZT- 5H wafers are measured simultaneously by imaging the wafer’s cross section under free mechanical boundary conditions. The large piezoresponse at switching domains and nonlinear behavior of PZT-5H are visualized in strain-electric field butterfly loops. The results show DIC as a simple advantageous technique to use for the characterization of piezoelectric materials under the influence of any field and physical constraints.
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Mohammad H. Malakooti and Henry A. Sodano "Simultaneous measurement of longitudinal and lateral piezoelectric strain coefficients using digital image correlation", Proc. SPIE 8688, Active and Passive Smart Structures and Integrated Systems 2013, 868812 (10 April 2013); https://doi.org/10.1117/12.2008838
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KEYWORDS
Digital image correlation

Semiconducting wafers

Ferroelectric materials

Switching

Piezoelectric effects

Polarization

Electrodes

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