Paper
9 September 2013 A fast convolution method using basis expansion for highly efficient intensity calculation in mask optimization
Yaping Sun, Yehua Zuo, Jinyu Zhang, Yan Wang, Zhiping Yu
Author Affiliations +
Abstract
Finer grid representation is inevitable to describing mask patterns more accurately in inverse lithography technology (ILT), thus resulting in large-size mask representation and heavy computational cost. In this work we proposed a fast convolution method called convolution using basis expansion (CBE) method to resolve computational issues caused by intensive convolutions. The CBE method process can be elaborated as: 1) Project mask and kernel matrices from fine grid representation to coarse grid representation under certain basis functions, which is similar to DCT or wavelet transformations. This matrix formed by the expansion coefficient can be considered as the projection of the original large matrix on coarse grid; 2) Perform mask and kernel convolutions on coarse grids; 3) the convolution result on fine grids is restored by interpolation method. The selection of the basis set can be arbitrary. In this paper, we compare the convolution accuracy and computational cost using 1) linear basis function; 2)discrete cosine basis function; 3) basis function based on K-L transform for different fine and coarse matrix size ratios n in both 1-D and 2-D conditions. Also, the quantitative interpolation error of cubic spline interpolation function is discussed. In numerical verification of aerial image calculation, this new method provides almost the same effectiveness and 10X~20X running speed improvement comparing to traditional convolution method. The CBE method will show its large effectiveness and efficiency in mask optimization.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yaping Sun, Yehua Zuo, Jinyu Zhang, Yan Wang, and Zhiping Yu "A fast convolution method using basis expansion for highly efficient intensity calculation in mask optimization", Proc. SPIE 8880, Photomask Technology 2013, 888026 (9 September 2013); https://doi.org/10.1117/12.2027487
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Convolution

Matrices

Photomasks

Lithography

Atrial fibrillation

Rutherfordium

Source mask optimization

RELATED CONTENT

11nm logic lithography with OPC-lite
Proceedings of SPIE (March 31 2014)
Mask optimization method based on residual network
Proceedings of SPIE (October 14 2022)
A machine learning approach to inverse lithography
Proceedings of SPIE (January 01 1900)
450mm lithography status for high volume manufacturing
Proceedings of SPIE (March 24 2017)

Back to Top