Interframe Jitter Measurement Technique

J. C. Brown

doi:10.1117/12.944283

3 May 1988 Interframe Jitter Measurement Technique

J. C. Brown

Proceedings Volume 0890, Infrared Systems and Components II; (1988) https://doi.org/10.1117/12.944283
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States

Abstract

A noninvasive technique for the measurement of image jitter has been developed. This technique has been applied to a common module thermal imager to show that scanner position oscillations about linearity are exacerbated by power supply fluctuations.

Citation Download Citation

J. C. Brown "Interframe Jitter Measurement Technique", Proc. SPIE 0890, Infrared Systems and Components II, (3 May 1988); https://doi.org/10.1117/12.944283

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available