Paper
10 October 2013 Characteristics of the higher-order resonant cantilever in dynamic atomic force microscopy
Yang Zhao, Qiang-xian Huang, Dan Yuan, Huan-jie You, Hong Xie
Author Affiliations +
Proceedings Volume 8916, Sixth International Symposium on Precision Mechanical Measurements; 89160F (2013) https://doi.org/10.1117/12.2035924
Event: Sixth International Symposium on Precision Mechanical Measurements, 2013, Guiyang, China
Abstract
In order to improve the performances of dynamic atomic force microscopy (AFM), a higher-order resonant cantilever which is driven at its second order or even higher-order resonant frequency instead of its first order resonant frequency is proposed. Due to the increase in the frequency and quality factor of the higher-order resonant cantilever, the response time, air damping coefficient are reduced and the detecting sensitivity of the cantilever is improved. Meanwhile, because the angular deflection of the cantilever under higher-order resonant vibration is larger than that under the first order resonant vibration, the optical magnification level of the higher-order resonant cantilever is several times larger than that of the first order when the optical lever method is adopted to detect the variation of the cantilever. Theoretical analysis and experimental results show that the scanning method done by a higher-order cantilever is effective and feasible, and the scanning characteristics of dynamic AFM with the higher-order resonant cantilever are promoted obviously compared with that of the AFM operated in the first-order.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yang Zhao, Qiang-xian Huang, Dan Yuan, Huan-jie You, and Hong Xie "Characteristics of the higher-order resonant cantilever in dynamic atomic force microscopy", Proc. SPIE 8916, Sixth International Symposium on Precision Mechanical Measurements, 89160F (10 October 2013); https://doi.org/10.1117/12.2035924
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KEYWORDS
Atomic force microscopy

Thermal effects

Atmospheric optics

Chemical analysis

Differential equations

Spatial resolution

Analytical research

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