Paper
10 October 2013 Optimizing the structure of a four-axis polarized scattering instrument using a double-loop approach
Chien-Jong Shih, Tso-Liang Teng, Yong-An Huang
Author Affiliations +
Proceedings Volume 8916, Sixth International Symposium on Precision Mechanical Measurements; 89161O (2013) https://doi.org/10.1117/12.2035632
Event: Sixth International Symposium on Precision Mechanical Measurements, 2013, Guiyang, China
Abstract
A new four-axis polarized scattering instrument is presented in this paper. In order to capture instrumental characteristics, the finite element analysis has been utilized to investigate the static behaviors such as the structural volume and tip deflection. Both topological and parametric optimization in presenting double-loop approach results in optimum material distribution and volume fraction. The resulting optimum model has been further modified to a solid prototype for final product design. The ultimate result shows that the tip deflection, material volume can evidently be optimized so that the enhancement of instrumental precision can be achieved. The proposed exploration of process and skill can provide for general mechanical structural design in creative sense.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chien-Jong Shih, Tso-Liang Teng, and Yong-An Huang "Optimizing the structure of a four-axis polarized scattering instrument using a double-loop approach", Proc. SPIE 8916, Sixth International Symposium on Precision Mechanical Measurements, 89161O (10 October 2013); https://doi.org/10.1117/12.2035632
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KEYWORDS
Computer aided design

Scattering

Finite element methods

Mechanical engineering

Structural design

Product engineering

Bidirectional reflectance transmission function

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