Emergency OSL/TL dosimetry with integrated circuits from mobile phones

S. Sholom; S. W. S. McKeever

doi:10.1117/12.2064302

5 September 2014 Emergency OSL/TL dosimetry with integrated circuits from mobile phones

S. Sholom, S. W. S. McKeever

Proceedings Volume 9213, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVI; 921319 (2014) https://doi.org/10.1117/12.2064302
Event: SPIE Optical Engineering + Applications, 2014, San Diego, California, United States

Abstract

Integrated circuits (ICs) from several mobile phones were studied as possible emergency dosimeters using optically stimulated luminescence (OSL) and thermoluminescence (TL) techniques. Measurement protocols were developed for ICs that take into consideration the effect of sensitization of the samples with increasing dose as well as fading of the signals after sample exposure. It was found that the OSL technique has a higher sensitivity with ICs when compared to TL, while the TL signals were characterized by better stability with time after exposure. Values of minimum measurable doses were found to be in the range between a few tens of mGy and several tens of mGy for the tested samples. It was concluded that ICs from mobile phones could be used for emergency dose reconstruction.

Citation Download Citation

S. Sholom and S. W. S. McKeever "Emergency OSL/TL dosimetry with integrated circuits from mobile phones", Proc. SPIE 9213, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVI, 921319 (5 September 2014); https://doi.org/10.1117/12.2064302

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