Paper
13 March 2015 Finely control groove-depth variations of large-area diffraction gratings
Lixiang Wu, Keqiang Qiu, Xiaolong Jiang, Yanchang Zheng, Xiangdong Xu, Yilin Hong, Shaojun Fu
Author Affiliations +
Abstract
We proposed a technique for conducting on-the-fly fine adjustment of etch depths with sub-nanometer precision during the course of ion beam etching (IBE). Simulations were performed to evaluate the etch-depth control precision. The simulation prediction shows that the precision of fine control of etch depths is at the level of 0.1nm. The preliminary experiment was conducted. The early result and the simulation prediction are in agreement with each other, which indicates that this approach is feasible for finely controlling groove-depth variations of large-area diffraction gratings.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lixiang Wu, Keqiang Qiu, Xiaolong Jiang, Yanchang Zheng, Xiangdong Xu, Yilin Hong, and Shaojun Fu "Finely control groove-depth variations of large-area diffraction gratings", Proc. SPIE 9374, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics VIII, 937411 (13 March 2015); https://doi.org/10.1117/12.2077396
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Cited by 1 scholarly publication.
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KEYWORDS
Etching

Ion beams

Raster graphics

Diffraction gratings

Ions

Algorithm development

Optical components

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