Paper
18 December 2014 Radiation-induced mismatch enhancement in 65nm CMOS SRAM for space applications
Maxim S. Gorbunov, Pavel S. Dolotov, Alexandra I. Shnaider, Gennady I. Zebrev, Andrey A. Antonov, Anatoly A. Lebedev
Author Affiliations +
Proceedings Volume 9440, International Conference on Micro- and Nano-Electronics 2014; 944019 (2014) https://doi.org/10.1117/12.2180610
Event: The International Conference on Micro- and Nano-Electronics 2014, 2014, Zvenigorod, Russian Federation
Abstract
We study the Radiation-Induced Mismatch Enhancement (RIME) in 65 nm CMOS SRAM block designed for space applications. X-ray and heavy ion irradiation increase the number of non-rewriting cells.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maxim S. Gorbunov, Pavel S. Dolotov, Alexandra I. Shnaider, Gennady I. Zebrev, Andrey A. Antonov, and Anatoly A. Lebedev "Radiation-induced mismatch enhancement in 65nm CMOS SRAM for space applications", Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944019 (18 December 2014); https://doi.org/10.1117/12.2180610
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KEYWORDS
Monte Carlo methods

Ions

Transistors

Oxides

Silicon

X-rays

Error analysis

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