Image registration under symmetric conditions: novel approach

Prakash Duraisamy; Amr Yousef; Bill Buckles; Steve Jackson

doi:10.1117/12.2179093

20 April 2015 Image registration under symmetric conditions: novel approach

Prakash Duraisamy, Amr Yousef, Bill Buckles, Steve Jackson

Proceedings Volume 9477, Optical Pattern Recognition XXVI; 94770N (2015) https://doi.org/10.1117/12.2179093
Event: SPIE Defense + Security, 2015, Baltimore, MD, United States

Abstract

Registering the 2D images is one of the important pre-processing steps in many computer vision applications like 3D reconstruction, building panoramic images. Contemporary registration algorithm like SIFT (Scale Invariant Feature transform) was not quite success in registering the images under symmetric conditions and under poor illuminations using DoF (Difference of Gaussian) features. In this paper, we introduced a novel approach for registering the images under symmetric conditions.

Citation Download Citation

Prakash Duraisamy, Amr Yousef, Bill Buckles, and Steve Jackson "Image registration under symmetric conditions: novel approach", Proc. SPIE 9477, Optical Pattern Recognition XXVI, 94770N (20 April 2015); https://doi.org/10.1117/12.2179093

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available