Paper
12 May 2015 Performance testing of a novel off-plane reflection grating and silicon pore optic spectrograph at PANTER
Author Affiliations +
Abstract
An X-ray spectrograph consisting of aligned, radially ruled off-plane reflection gratings and silicon pore optics (SPO) was tested at the Max Planck Institute for extraterrestrial Physics PANTER X-ray test facility. The SPO is a test module for the proposed Arcus mission, which will also feature aligned off-plane reflection gratings. This test is the first time two off-plane gratings were actively aligned to each other and with a SPO to produce an overlapped spectrum. We report the performance of the complete spectrograph utilizing the aligned gratings module and plans for future development.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hannah Marlowe, Randall L. McEntaffer, Ryan Allured, Casey DeRoo, Drew M. Miles, Benjamin D. Donovan, James H. Tutt, Vadim Burwitz, Benedikt Menz, Gisela D. Hartner, Randall K. Smith, Ramses Günther, Alex Yanson, Giuseppe Vacanti, and Marcelo Ackermann "Performance testing of a novel off-plane reflection grating and silicon pore optic spectrograph at PANTER", Proc. SPIE 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV, 95100O (12 May 2015); https://doi.org/10.1117/12.2185693
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Spectrographs

Sensors

X-rays

Semiconducting wafers

Silicon

Charge-coupled devices

CCD image sensors

RELATED CONTENT

Semiconductor materials for digital mammography
Proceedings of SPIE (April 25 2000)
High Resolution X-Ray-Tv-Sensors
Proceedings of SPIE (February 01 1985)

Back to Top