Polarization sensitivity testing of off-plane reflection gratings

Hannah Marlowe; Randal L. McEntaffer; Casey T. DeRoo; Drew M. Miles; James H. Tutt; Christian Laubis; Victor Soltwisch

doi:10.1117/12.2186344

4 September 2015 Polarization sensitivity testing of off-plane reflection gratings

Hannah Marlowe, Randal L. McEntaffer, Casey T. DeRoo, Drew M. Miles, James H. Tutt, Christian Laubis, Victor Soltwisch

Proceedings Volume 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII; 960318 (2015) https://doi.org/10.1117/12.2186344
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

Off-Plane reflection gratings were previously predicted to have different efficiencies when the incident light is polarized in the transverse-magnetic (TM) versus transverse-electric (TE) orientations with respect to the grating grooves. However, more recent theoretical calculations which rigorously account for finitely conducting, rather than perfectly conducting, grating materials no longer predict significant polarization sensitivity. We present the first empirical results for radially ruled, laminar groove profile gratings in the off-plane mount which demonstrate no difference in TM versus TE efficiency across our entire 300-1500 eV bandpass. These measurements together with the recent theoretical results confirm that grazing incidence off-plane reflection gratings using real, not perfectly conducting, materials are not polarization sensitive.

Citation Download Citation

Hannah Marlowe, Randal L. McEntaffer, Casey T. DeRoo, Drew M. Miles, James H. Tutt, Christian Laubis, and Victor Soltwisch "Polarization sensitivity testing of off-plane reflection gratings", Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 960318 (4 September 2015); https://doi.org/10.1117/12.2186344

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