Investigation of a near-infrared-ray computed tomography scanner

Eiichi Sato; Yasuyuki Oda; Yuichi Satoi; Satoshi Yamaguchi; Tomotaka Ishii; Osahiko Hagiwara; Hiroshi Matsukiyo; Manabu Watanabe; Shinya Kusachi

doi:10.1117/12.2240111

3 October 2016 Investigation of a near-infrared-ray computed tomography scanner

Eiichi Sato, Yasuyuki Oda, Yuichi Satoi, Satoshi Yamaguchi, Tomotaka Ishii, Osahiko Hagiwara, Hiroshi Matsukiyo, Manabu Watanabe, Shinya Kusachi

Author Affiliations +

Proceedings Volume 9969, Radiation Detectors: Systems and Applications XVII; 99690I (2016) https://doi.org/10.1117/12.2240111
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

In the near-infrared-ray computed tomography (NIR-CT) scanner, NIR rays are produced from a light-emitting diode (LED) and detected using an NIR phototransistor (PT). The wavelengths of the LED peak intensity and the PT high sensitivity in the data table are both 940 nm. The photocurrents flowing through the PTR are converted into voltages using an emitter-follower circuit, and the output voltages are sent to a personal computer through an analog-digital converter. The NIR projection curves for tomography are obtained by repeated linear scans and rotations of the object, and the scanning is conducted in both directions of its movement.

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Citation Download Citation

Eiichi Sato, Yasuyuki Oda, Yuichi Satoi, Satoshi Yamaguchi, Tomotaka Ishii, Osahiko Hagiwara, Hiroshi Matsukiyo, Manabu Watanabe, and Shinya Kusachi "Investigation of a near-infrared-ray computed tomography scanner", Proc. SPIE 9969, Radiation Detectors: Systems and Applications XVII, 99690I (3 October 2016); https://doi.org/10.1117/12.2240111

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