Presentation
9 March 2023 Nanomechanical squeezing through strong optical measurements for quantum metrology
Author Affiliations +
Abstract
Nano- and micromechanical oscillators act as great sensors of a wide variety of signals, but their sensitivity and bandwidth can be limited by quantum backaction imposed by optomechanical displacement measurement. We experimentally demonstrate a new paradigm for optomechanical measurement and control based on strong interactions with short light pulses. Using unique nanophotonic optomechanical cavities, we show that single pulsed measurements can achieve sub-quantum-limit resolution. Moreover, we demonstrate a new protocol to deterministically produce squeezed mechanical states, which can reduce single-quadrature fluctuations to arbitrarily small magnitudes. We discuss the application of the resulting squeezing and entanglement for mechanical quantum sensing.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pascal Neveu, Jack Clarke, Michael Vanner, and Ewold Verhagen "Nanomechanical squeezing through strong optical measurements for quantum metrology", Proc. SPIE PC12447, Quantum Sensing, Imaging, and Precision Metrology, PC1244730 (9 March 2023); https://doi.org/10.1117/12.2649302
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KEYWORDS
Metrology

Optical testing

Oscillators

Mechanical sensors

Sensors

Nanophotonics

Optomechanical design

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