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4 October 2024 Towards stimulated resonant inelastic x-ray scattering imaging using an x-ray free-electron laser
Yu Nakata, Jordan T. O'Neal, Kai Sakurai, Kyota Yoshinaga, Takenori Shimamura, Takashi Kimura
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Proceedings Volume PC13150, Advances in X-Ray/EUV Optics and Components XIX; PC1315008 (2024) https://doi.org/10.1117/12.3026271
Event: Optical Engineering + Applications, 2024, San Diego, California, United States
Abstract
Resonant inelastic x-ray scattering (RIXS) is a widely used spectroscopic technique for analyzing elementary excitations. However, this process is inefficient and thus difficult to apply to imaging. We propose to stimulate the RIXS (SRIXS) process using a soft x-ray free-electron laser (SXFEL), increasing the photon yield by up to 6 orders of magnitude [Higley, Commun. Phys. 5 83 (2022)]. By designing a new achromatic full-field twin Wolter mirror microscope and multi-aperture grating, it should become possible to measure SRIXS by imaging the full x-ray spectrum at many spatial points simultaneously. To test the feasibility of SRIXS imaging, we simulate the SRIXS signal strength with a three-level Maxwell-Bloch model. Using the parameters of the SACLA BL1 SXFEL, we show that SRIXS imaging is feasible, requiring a peak intensity of 1016 W/cm2 and sub-micron focus size, readily achievable with the proposed microscope.
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Yu Nakata, Jordan T. O'Neal, Kai Sakurai, Kyota Yoshinaga, Takenori Shimamura, and Takashi Kimura "Towards stimulated resonant inelastic x-ray scattering imaging using an x-ray free-electron laser", Proc. SPIE PC13150, Advances in X-Ray/EUV Optics and Components XIX, PC1315008 (4 October 2024); https://doi.org/10.1117/12.3026271
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KEYWORDS
X-rays
X-ray imaging
Laser scattering
X-ray lasers
Free electron lasers
Color
Simulations
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