Magnification-continuous static calibration model of a scanning-electron microscope

Abed C. Malti; Sounkalo Dembélé; Nadine Le Fort-Piat; Patrick Rougeot; Roland Salut

doi:10.1117/1.JEI.21.3.033020

28 September 2012 Magnification-continuous static calibration model of a scanning-electron microscope

Abed C. Malti, Sounkalo Dembélé, Nadine Le Fort-Piat, Patrick Rougeot, Roland Salut

Author Affiliations +

Journal of Electronic Imaging, Vol. 21, Issue 3, 033020 (September 2012). https://doi.org/10.1117/1.JEI.21.3.033020

Abstract

We present a new calibration model of both static distortion and projection for a scanning-electron microscope (SEM). The proposed calibration model depends continuously on the magnification factor. State-of-the-art methods have proposed models to solve the static distortion and projection model but for a discrete set of low and high magnifications: at low magnifications, existing models assume static distortion and perspective projection. At high magnifications, existing models assume an orthogonal projection without presence of static distortion. However, a magnification-continuous model which defines continuous switch from low to high magnifications has not yet been proposed. We propose a magnification-continuous static calibration model of the SEM. The static distortion and intrinsics of the projection matrix are modeled by partial differential equations (PDEs) with respect to magnification. The approach is applied with success to the JEOL-JSM 820 in a secondary electron imaging mode for magnification ranging from 100× to 10k×. The final RMS reprojection error is about 0.9 pixels. This result together with two application-based experiments: the consistent measurements of the bending of a cantilever and a 3-D reconstruction of a nano-ball emphasize the relevance of the proposed approach.

Citation Download Citation

Abed C. Malti, Sounkalo Dembélé, Nadine Le Fort-Piat, Patrick Rougeot, and Roland Salut "Magnification-continuous static calibration model of a scanning-electron microscope," Journal of Electronic Imaging 21(3), 033020 (28 September 2012). https://doi.org/10.1117/1.JEI.21.3.033020

Published: 28 September 2012

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE