Characterization of active waveguide photonic devices using optical coherence domain reflectometry

Bruce D. Patterson

doi:10.1117/12.200609

1 August 1995 Characterization of active waveguide photonic devices using optical coherence domain reflectometry

Bruce D. Patterson

Author Affiliations +

Optical Engineering, Vol. 34, Issue 8, (August 1995). https://doi.org/10.1117/12.200609

Abstract

Internal reflections occurring in the waveguides of incoherently emitting photonic devices are mapped using a novel optical coherence domain reflectometry (OCDR) technique, where the light source is the device itself. Such reflections may be caused by cleaved facets, inadvertent waveguide defects, or mntentmonal submicrometer structures. How this OCDR technique is applied to the characterization of a 1.3-μm superluminescent diode with unintentional defects and with isolated and periodic structures produced by focused-ion beam milling is described. A two-pole network theory is used to model the observed effects.

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Bruce D. Patterson "Characterization of active waveguide photonic devices using optical coherence domain reflectometry," Optical Engineering 34(8), (1 August 1995). https://doi.org/10.1117/12.200609

Published: 1 August 1995

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