Interferometric measurements of small-scale irregularities: highly reflecting surfaces

Parameswaran Hariharan

doi:10.1117/1.601814

1 October 1998 Interferometric measurements of small-scale irregularities: highly reflecting surfaces

Parameswaran Hariharan

Optical Engineering, Vol. 37, Issue 10, (October 1998). https://doi.org/10.1117/1.601814

With uncoated optical surfaces, it is possible to use a Fizeau interferometer to make direct measurements of small-scale irregularities with very small amplitudes. However, problems arise with highly reflecting surfaces. Some optical systems that can be used for such measurements are described.

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Parameswaran Hariharan "Interferometric measurements of small-scale irregularities: highly reflecting surfaces," Optical Engineering 37(10), (1 October 1998). https://doi.org/10.1117/1.601814

Published: 1 October 1998

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