28 June 2019 Highly efficient subwavelength imaging in mid-IR range using high dielectric hexagonal lattice photonic crystals
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Abstract
Two-dimensional hole-type hexagonal lattice photonic crystals with low and high dielectric materials have been investigated for the aim of achieving all-angle negative refraction for subwavelength imaging. Structures composed of Si (εSi  =  12 at IR) and PbTe (εPbTe  =  36 at mid-IR) have been regarded, as sample materials. All-angle negative refraction has been achieved for the TM polarization in the second band under the light line in a broad bandwidth of 26% and 31% for low and high dielectric materials, respectively. The optimized radii for low and high dielectric PCs equal to 0.31a and 0.35a and provide the spatial full width at half maximum of 0.37λ and 0.38λ, respectively. The structures present TE gap in the operating wavelength range, and this feature of the structures can be applied to design polarization beam splitters in integrated space division multiplexing.
© 2019 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2019/$25.00 © 2019 SPIE
Mansour Zaremanesh and Mina Noori "Highly efficient subwavelength imaging in mid-IR range using high dielectric hexagonal lattice photonic crystals," Optical Engineering 58(6), 067108 (28 June 2019). https://doi.org/10.1117/1.OE.58.6.067108
Received: 30 December 2018; Accepted: 13 June 2019; Published: 28 June 2019
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Cited by 2 scholarly publications.
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KEYWORDS
Dielectrics

Mid-IR

Dielectric polarization

Range imaging

Image resolution

Photonic crystals

Binary data

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