Open Access
12 November 2019 Principles of surface-phase-resolved shearography
Author Affiliations +
Abstract

There is a need to remotely measure the full phase and amplitude information of small-scale acousto-seismic vibrations in order to detect the presence of buried objects (e.g., tunnels, etc.), or for other purposes. This remote sensing information may need to be collected with a large area coverage rate and at a safe standoff distance. To accomplish this, we have implemented a shearographic imaging system that incorporates phase stepping in a novel way, automatically separating random speckle noise from surface motion, without requiring an intermediate unwrapping step. This method, which we call surface-phase-resolved shearography, is especially effective for very low-amplitude motions that generate less than one light-wavelength of phase change. In laboratory studies, we have demonstrated sensitivity of two nanometers RMS with 532-nm-wavelength light.

CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Michael J. DeWeert, Andrew N. Acker, Reid Noguchi, Dugan Yoon, and Gary Sawai "Principles of surface-phase-resolved shearography," Optical Engineering 58(11), 114103 (12 November 2019). https://doi.org/10.1117/1.OE.58.11.114103
Received: 25 June 2019; Accepted: 10 October 2019; Published: 12 November 2019
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
KEYWORDS
Speckle

Shearography

Picosecond phenomena

Commercial off the shelf technology

Optical engineering

Interference (communication)

Cameras

Back to Top