5 August 2021 Direct measurement of the van der Waals force between a pair of microspheres based on photonic force microscopy
Mingrun Pei, Shilong Jin, Xinlin Chen, Tengfang Kuang, Wei Xiong, Xiang Han, Guangzong Xiao, Hui Luo
Author Affiliations +
Abstract

We present a method for measuring the van der Waals force between two microspheres based on photonic force microscopy. We trapped a microsphere as probe by optical tweezers. The restricted Brownian motion of Gaussian distribution could be found in this system. The vibration center of the probe was affected by the van der Waals force when a target microsphere was closer to the probe. We measured the vibration center of the probe at different separation between the pair of microspheres. Based on this, the measurement of the van der Waals force between the two microspheres was realized with a high precision. Our method can realize the direct measurement of van der Waals force without using the variation rules of it. This method results in a simple structure, would not damage the sample, and can be suitable for the surface of any shape. It is general and has a wide range of applications in other fields of micro-force measurement.

© 2021 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2021/$28.00 © 2021 SPIE
Mingrun Pei, Shilong Jin, Xinlin Chen, Tengfang Kuang, Wei Xiong, Xiang Han, Guangzong Xiao, and Hui Luo "Direct measurement of the van der Waals force between a pair of microspheres based on photonic force microscopy," Optical Engineering 60(8), 084101 (5 August 2021). https://doi.org/10.1117/1.OE.60.8.084101
Received: 5 June 2021; Accepted: 22 July 2021; Published: 5 August 2021
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KEYWORDS
Particles

Microscopy

Photonic microstructures

Silica

Optical engineering

Motion measurement

Optical tweezers

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