Prof. Alexander M. Korsunsky
at Univ of Oxford
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 5 March 2021 Presentation + Paper
J. Cvjetinovic, Yekaterina Bedoshvili, Daniil Nozdriukhin, Olga Efimova, Alexey Salimon, Nadezhda Volokitina, Alexander Korsunsky, Dmitry Gorin
Proceedings Volume 11641, 116410G (2021) https://doi.org/10.1117/12.2588254
KEYWORDS: Photoacoustic spectroscopy, Luminescence, Silica, Photoacoustic imaging, Raster graphics, Optoacoustics, Optical properties, Fluorescence lifetime imaging, Environmental monitoring, Chromophores

Proceedings Article | 22 December 2015 Paper
Alexander J. Lunt, Gaurav Mohanty, Tee Neo, Johann Michler, Alexander Korsunsky
Proceedings Volume 9668, 96685S (2015) https://doi.org/10.1117/12.2199217
KEYWORDS: Interfaces, Scanning electron microscopy, Failure analysis, Neodymium, Profiling, Manufacturing, Zirconium dioxide, Diamond, Video, Field emission displays

Proceedings Article | 31 March 2010 Paper
Proceedings Volume 7644, 76440A (2010) https://doi.org/10.1117/12.845837
KEYWORDS: Crystals, Reflection, Single crystal X-ray diffraction, Ferroelectric materials, Synchrotrons, X-rays, Atomic force microscopy, Scanning electron microscopy, X-ray diffraction, Photomicroscopy

Proceedings Article | 12 April 2005 Paper
Alexander Korsunsky, Kyungmok Kim, Colin Chiu
Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621898
KEYWORDS: Laser scanners, Aluminum, Resistance, Heat treatments, Laser scattering, Experimental mechanics, Control systems, Light scattering, Roads, Aerospace engineering

Proceedings Article | 12 April 2005 Paper
Alexander Korsunsky, Gabriel Regino, David Nowell
Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621737
KEYWORDS: Data modeling, Stress analysis, Distortion, Inverse problems, Diffraction, Nickel, X-ray diffraction, Crystals, Aerospace engineering, Photons

Conference Committee Involvement (2)
SPIE Micro+Nano Materials, Devices, and Systems
7 December 2015 | Sydney, New South Wales, Australia
SPIE Micro+Nano Materials, Devices, and Systems
9 December 2013 | Melbourne, Victoria, Australia
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