Alvin Wei Wen Tan
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 February 2024 Paper
Proceedings Volume 13069, 1306919 (2024) https://doi.org/10.1117/12.3023396
KEYWORDS: Agriculture, Inspection, X-rays, X-ray imaging, X-ray sources, Neural networks, Sensors, Education and training, Transformers, X-ray detectors

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