Prof. Bernard D. Drevillon Profile

Prof. Bernard D. Drevillon

Director of LPICM at Ecole Polytechnique

SPIE Involvement:

Author

Publications (24)

SPIE Journal Paper | 22 June 2016 Open Access

Open Access

Special Section Guest Editorial:Antonello De Martino (1954–2014): in memoriam

Tatiana Novikova, Bernard Drévillon, Laurent Schwartz, Pierre Validire, André Nazac, Razvigor Ossikovski, Enric Garcia-Caurel, Blandine Laude-Boulesteix, Makrina Anastasiadou, Maria Losurdo, Kurt Hinderl, Bicher Haj Ibrahim, Maria Rosaria Antonelli, Angelo Pierangelo, Stanislas Deby, Stéphane Roussel, Sandeep Manhas, Jérémy Vizet, Dominique Pagnoux, Stéphane Bancelin, Marie-Claire Schanne-Klein, Jean Rehbinder, Huda Haddad, François Moreau, Jean-Charles Vanel, Pere Roca i Cabarrocas, Valery Tuchin, Steven Jacques

JBO, Vol. 21, Issue 07, 071101, (June 2016) https://doi.org/10.1117/12.10.1117/1.JBO.21.7.071101

KEYWORDS: Polarimetry, Biomedical optics, Physics, Infrared radiation, Cervical cancer, Head, Interfaces, Thin films, Scientific research, Quantum optics

Proceedings Article | 12 April 2007 Paper

Paper

Optics of nanogratings

M. Foldyna, K. Postava, R. Ossikovski, A. De Martino, E. Garcia-Caurel, B. Drevillon, J. Pištora, T. Yamaguchi

Proceedings Volume 6609, 660903 (2007) https://doi.org/10.1117/12.739345

KEYWORDS: Diffraction gratings, Refractive index, Dielectrics, Optical properties, Absorption, Electro optical modeling, Diffraction, Oscillators, Data modeling, Metals

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Proceedings Article | 5 April 2007 Paper

Paper

Metrology of replicated diffractive optics with Mueller polarimetry in conical diffraction

Tatiana Novikova, Antonello De Martino, Pavel Bulkin, Quang Nguyen, Bernard Drévillon, Vladimir Popov, Alexander Chumakov

Proceedings Volume 6518, 65184E (2007) https://doi.org/10.1117/12.711401

KEYWORDS: Diffraction gratings, Atomic force microscopy, Polarimetry, Nickel, Metrology, Diffraction, Solids, Spectroscopy, Holograms, Electroplating

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Proceedings Article | 24 March 2006 Paper

Paper

Decorrelation of fitting parameters by Mueller polarimetry in conical diffraction

Antonello De Martino, Tatiana Novikova, Christophe Arnold, Sami BenHatit, Bernard Drévillon

Proceedings Volume 6152, 61521H (2006) https://doi.org/10.1117/12.654834

KEYWORDS: Silica, Diffraction, Diffraction gratings, Polarimetry, Atomic force microscopy, Etching, Data modeling, Interfaces, Statistical modeling, Photoresist materials

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Proceedings Article | 5 October 2005 Paper

Paper

Optical thin films deposition by MDECR-PECVD

Bicher Haj Ibrahim, Pavel Bulkin, Dmitri Daineka, Bernard Drévillon

Proceedings Volume 5963, 59631Q (2005) https://doi.org/10.1117/12.624825

KEYWORDS: Gradient-index optics, Ellipsometry, Antireflective coatings, Antennas, Plasma, Glasses, Silicon, Process control, Microwave radiation, Spectroscopy

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Proceedings Article | 10 May 2005 Paper

Paper

Characterization of gratings by Mueller polarimetry in conical diffraction

Antonello De Martino, Tatiana Novikova, Sami BenHatit, Bernard Drevillon, Denis Cattelan

Proceedings Volume 5752, (2005) https://doi.org/10.1117/12.600537

KEYWORDS: Diffraction, Diffraction gratings, Polarimetry, Mueller matrices, Cadmium sulfide, Metrology, Polarization, Calibration, Polysomnography, Silicon

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Proceedings Article | 13 July 2004 Paper

Paper

Mueller polarimetric microscopy

Blandine Laude-Boulesteix, Antonello De Martino, Gilles Le Naour, Catherine Genestie, Laurent Schwartz, Enric Garcia-Caurel, Bernard Drevillon

Proceedings Volume 5324, (2004) https://doi.org/10.1117/12.527975

KEYWORDS: Polarimetry, Collagen, Polarization, Liquid crystals, Birefringence, Calibration, Biopsy, Arteries, Polarizers, Linear polarizers

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Proceedings Article | 13 July 2004 Paper

Paper

Polarized images of the cervix

Blandine Laude-Boulesteix, Andre Nazac, Gilles Le Naour, Catherine Genestie, Laurent Schwartz, Bernard Drevillon, Antonello De Martino

Proceedings Volume 5312, (2004) https://doi.org/10.1117/12.529011

KEYWORDS: Cervix, Tissues, Polarization, Light scattering, Imaging systems, Polarimetry, Linear polarizers, Liquid crystals, CCD cameras, Biopsy

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Proceedings Article | 14 October 2003 Paper

Paper

A Mueller polarimetric imaging system for biomedical applications

Blandine Laude, Antonello De Martino, Gilles Le Naour, Catherine Genestie, Andre Nazac, Steve Guyot, Bernard Clairac, Enric Garcia Caurel, Bernard Drevillon, Laurent Schwartz

Proceedings Volume 5143, (2003) https://doi.org/10.1117/12.500670

KEYWORDS: Polarimetry, Liquid crystals, Calibration, Polarization, Biopsy, Collagen, Tissues, Polysomnography, CCD cameras, Liver

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Proceedings Article | 8 October 2003 Paper

Paper

Application of FTIR ellipsometry to detect and classify micro-organisms

Enric Garcia-Caurel, Jacqueline Nguyen, Laurent Schwartz, Bernard Drevillon

Proceedings Volume 5141, (2003) https://doi.org/10.1117/12.500939

KEYWORDS: Bacteria, Ellipsometry, Microorganisms, Absorption, Databases, FT-IR spectroscopy, Principal component analysis, Mid-IR, Molecules, Polarization

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Proceedings Article | 1 July 2003 Paper

Paper

Noninvasive electrical characterization of semiconductor at bulk and interfaces

Regis Vanderhaghen, Samir Kasouit, Bernard Drevillon, Virginia Chu, Joao Conde, Hyunjong Kim, Jean Paul Kleider

Proceedings Volume 4999, (2003) https://doi.org/10.1117/12.482505

KEYWORDS: Interfaces, Silicon, Semiconductors, Diffusion, Microwave radiation, Ellipsometry, Ultraviolet radiation, Pulsed laser operation, Thin films, Crystals

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Proceedings Article | 21 May 2002 Paper

Paper

Noninvasive electrical characterization of semiconductor and interface

Samir Kasouit, Bernard Drevillon, Joao Conde, Hyun Jong Kim, Jean Paul Kleider, Regis Vanderhaghen

Proceedings Volume 4650, (2002) https://doi.org/10.1117/12.467666

KEYWORDS: Interfaces, Semiconductors, Microwave radiation, Diffusion, Silicon, Ellipsometry, Thin films, Pulsed laser operation, Silicon films, Crystals

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Proceedings Article | 15 May 2002 Paper

Paper

Three-dimensional microscopy through white light interferometry

Blandine Laude, Antonello De Martino, Bernard Drevillon, L Benattar, Laurent Schwartz

Proceedings Volume 4621, (2002) https://doi.org/10.1117/12.467829

KEYWORDS: Tomography, Optical coherence tomography, Microscopes, Interferometry, Mirrors, Microscopy, Charge-coupled devices, Cornea, Optical interferometry, CCD cameras

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Proceedings Article | 27 March 2002 Paper

Paper

Application of Fourier-transform infrared ellipsometry to quantify bioloical molecules in animal tissues

Enric Garcia-Caurel, Bernard Drevillon, Laurent Schwartz

Proceedings Volume 4614, (2002) https://doi.org/10.1117/12.460790

KEYWORDS: Ellipsometry, Tissues, Molecules, Chemical analysis, Infrared radiation, Biomedical optics, Spectroscopy, Tumors, Biochemistry, Tissue optics

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Proceedings Article | 2 November 2001 Paper

Paper

Full-field OCT with thermal light

Antonello De Martino, David Carrara, Bernard Drevillon, Laurent Schwartz

Proceedings Volume 4431, (2001) https://doi.org/10.1117/12.447398

KEYWORDS: Optical coherence tomography, Tomography, Microscopes, Interferometry, Mirrors, Spectral resolution, Objectives, Charge-coupled devices, CCD cameras, Light sources

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Proceedings Article | 23 October 2001 Paper

Paper

Mueller matrix measurements of small spherical particles deposited on c-Si wafer

Bernard Kaplan, Bernard Drevillon

Proceedings Volume 4447, (2001) https://doi.org/10.1117/12.446731

KEYWORDS: Particles, Optical spheres, Scattering, Spherical lenses, Semiconducting wafers, Light scattering, Silicon, Laser scattering, Polarization, Oxides

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Proceedings Article | 7 April 1999 Paper

Paper

Process monitoring of semiconductor thin films and interfaces by spectroellipsometry

Romain Brenot, Bernard Drevillon

Proceedings Volume 3629, (1999) https://doi.org/10.1117/12.344575

KEYWORDS: Crystals, Plasma, Interfaces, Thin films, Surface roughness, Amorphous silicon, Statistical modeling, Semiconductors, Ellipsometry, Silicon

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Proceedings Article | 19 August 1996 Paper

Paper

Real-time monitoring by multiwavelength ellipsometry of the growth of silicon alloy multilayers and gradient index structures

Morten Kildemo, S. Deniau, Pavel Bulkin, Bernard Drevillon, Ola Hunderi

Proceedings Volume 2776, (1996) https://doi.org/10.1117/12.246805

KEYWORDS: Refractive index, Multilayers, Feedback control, Ellipsometry, Optical coatings, Gradient-index optics, Plasma, Modulation, Process control, Reflection

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Proceedings Article | 24 April 1995 Paper

Paper

Modulated photoellipsometry measurements of GaAs internal field

Regis Vanderhaghen, S. Cueille, Bernard Drevillon, Razvigor Ossikovski

Proceedings Volume 2397, (1995) https://doi.org/10.1117/12.206863

KEYWORDS: Modulation, Gallium arsenide, Dielectrics, Spectroscopes, Ellipsometry, Phase shift keying, Polarization, Laser beam diagnostics, Semiconductor characterization, Optical components

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Proceedings Article | 16 April 1993 Paper

Paper

Recent in-situ studies of the evolution of surfaces and interfaces of thin films by spectroscopic phase-modulated ellipsometry

V. Yakovlev, Bernard Drevillon, Nace Layadi, Pere Roca i Cabarrocas

Proceedings Volume 1803, (1993) https://doi.org/10.1117/12.142934

KEYWORDS: Palladium, Ultraviolet radiation, Thin films, Spectroscopy, Ellipsometry, Diffusion, Amorphous silicon, Interfaces, Optical properties, Glasses

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Proceedings Article | 14 August 1992 Paper

Paper

Infrared phase-modulated ellipsometer for in-situ characterization of surfaces and thin films

Nadine Blayo, Bernard Drevillon, Razvigor Ossikovski

Proceedings Volume 1681, (1992) https://doi.org/10.1117/12.137728

KEYWORDS: Signal processing, Modulation, Sensors, Signal detection, Digital signal processing, Plasma, Thin films, Polarization, Mirrors, Infrared radiation

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Proceedings Article | 1 July 1992 Paper

Paper

In-situ characterization of thin film semiconductors by spectroellipsometry from ultraviolet to infrared

Bernard Drevillon

Proceedings Volume 1678, (1992) https://doi.org/10.1117/12.60460

KEYWORDS: Hydrogen, Plasma, Thin films, Ultraviolet radiation, Etching, Semiconductors, Silicon, Ellipsometry, Dielectrics, Surface roughness

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Proceedings Article | 1 March 1991 Paper

Paper

Reflectance anisotropy spectrometer for real-time crystal growth investigations

O. Acher, Ramdane Benferhat, Bernard Drevillon, Manijeh Razeghi

Proceedings Volume 1361, (1991) https://doi.org/10.1117/12.24360

KEYWORDS: Crystals, Reflectivity, Anisotropy, Spectroscopy, Ellipsometry, Signal detection, Signal processing, Modulation, Metalorganic chemical vapor deposition, Sensors

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Proceedings Article | 1 March 1991 Paper

Paper

In-situ investigation of the low-pressure MOCVD growth of III-V compounds using reflectance anisotropy measurements

Bernard Drevillon, Manijeh Razeghi

Proceedings Volume 1361, (1991) https://doi.org/10.1117/12.24320

KEYWORDS: Metalorganic chemical vapor deposition, Reflectivity, Anisotropy, Heterojunctions, Indium arsenide, Semiconductors, Epitaxy

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Showing 5 of 24 publications

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