Dr. Brian J. Simonds Profile

Dr. Brian J. Simonds

at National Institute of Standards and Technology

SPIE Involvement:

Conference Program Committee | Author

Proceedings Article | 12 March 2024 Presentation + Paper

Adjusting the microstructure of additively manufactured parts with tailored temperature fields by the combination of powder bed fusion with cw-laser and ablation with ultrashort laser pulses

Johannes Michel, Nico Ulff, Manuel Henn, Brian Simonds, Peter Hosemann, Frederik Zanger, Christian Hagenlocher, Thomas Graf

Proceedings Volume 12876, 1287609 (2024) https://doi.org/10.1117/12.3002302

KEYWORDS: Solids, Laser ablation, Additive manufacturing, Materials properties, Laser welding, Ablation, Alloys

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Proceedings Article | 21 November 2023 Presentation + Paper

NIST efforts in extreme-ultraviolet metrology

C. Tarrio, S. Grantham, R. Vest, T. Germer, B. Barnes, S. Moffitt, B. Simonds, M. Spidell

Proceedings Volume 12750, 127500F (2023) https://doi.org/10.1117/12.2686832

KEYWORDS: Extreme ultraviolet, Tunable filters, Metrology, Extreme ultraviolet lithography, Radiometry, Scatterometry, Vacuum chambers, Reflectivity, Polarization, Equipment

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Proceedings Article | 8 March 2019 Presentation

Measurement of melt pool dynamics in stationary laser welding using inline coherent imaging (Conference Presentation)

Troy Allen, Faleh AlTal, Brian Simonds, James Fraser

Proceedings Volume 10911, 109110H (2019) https://doi.org/10.1117/12.2509003

KEYWORDS: Laser welding, Coherence imaging, Image processing, Additive manufacturing, Transition metals, Metals, Video processing, Video, Coherence (optics), Interferometry

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Proceedings Article | 18 March 2016 Paper

Measuring laser power as a force: a new paradigm to accurately monitor optical power during laser-based machining operations

Paul Williams, Brian Simonds, Jeffrey Sowards, Joshua Hadler

Proceedings Volume 9741, 97410L (2016) https://doi.org/10.1117/12.2213300

KEYWORDS: Laser welding, Mirrors, Laser metrology, Power meters, Laser optics, Optics manufacturing, Radio optics, Metrology, Radiometry, Laser manufacturing, Calibration, Photodiodes, High power lasers, Reflectivity, Head, Prototyping

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Proceedings Article | 14 March 2016 Paper

Dual-beam laser thermal processing of silicon photovoltaic materials

Brian Simonds, Anthony Teal, Tian Zhang, Josh Hadler, Zibo Zhou, Sergey Varlamov, Ivan Perez-Würfl

Proceedings Volume 9735, 973505 (2016) https://doi.org/10.1117/12.2213583

KEYWORDS: Silicon, Photovoltaics, Silicon films, Laser processing, Thin films, Diffusion, Glasses, Silicon solar cells, Semiconducting wafers

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SPIE Journal Paper | 19 January 2015 Open Access

Laser processing for thin film chalcogenide photovoltaics: a review and prospectus

Brian Simonds, Helen Meadows, Sudhajit Misra, Christos Ferekides, Phillip Dale, Michael Scarpulla

JPE, Vol. 5, Issue 01, 050999, (January 2015) https://doi.org/10.1117/12.10.1117/1.JPE.5.050999

KEYWORDS: Annealing, Laser processing, Thin films, Photovoltaics, Selenium, Thin film solar cells, Crystals, Chalcogenides, Solar cells, Pulsed laser operation

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Proceedings Article | 8 October 2014 Paper

Sub-bandgap laser annealing of room temperature deposited polycrystalline CdTe

Brian Simonds, Sudhajit Misra, Naba Paudel, Koen Vandewal, Alberto Salleo, Christos Ferekides, Michael Scarpulla

Proceedings Volume 9180, 91800F (2014) https://doi.org/10.1117/12.2062178

KEYWORDS: Annealing, Absorption, Solar cells, Photovoltaics, Laser processing, Continuous wave operation, Optical testing, High power lasers, Thin films, Spectroscopy

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Proceedings Article | 16 September 2013 Paper

Pulsed UV laser annealing of polycrystalline CdTe

Brian Simonds, Vasilios Palekis, M. Khan, Chris Ferekides, Michael Scarpulla

Proceedings Volume 8826, 882607 (2013) https://doi.org/10.1117/12.2024437

KEYWORDS: Pulsed laser operation, 3D modeling, Ultraviolet radiation, Annealing, Scanning electron microscopy, Absorption, Data modeling, Chemical elements, Optical simulations, Thin films

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Proceedings Article | 21 September 2011 Paper

Optical and electrical properties of crystalline silicon wire arrays

Yu-Pan Pai, Brian Simonds, Jeremy Fields, Reuben Collins, P. Craig Taylor

Proceedings Volume 8111, 81110Z (2011) https://doi.org/10.1117/12.892553

KEYWORDS: Silicon, Etching, Solar cells, Semiconducting wafers, Reflectivity, Silver, Wafer-level optics, Crystals, Light scattering, Diffusion

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Proceedings Article | 7 September 2011 Paper

Silanization of plasma-grown silicon quantum dots for production of a tunable, stable, colloidal solution

Ingrid Anderson, Rebecca Shircliff, Benjamin Lee, Brian Simonds, Sumit Agarwal, Paul Stradins, Reuben Collins

Proceedings Volume 8094, 809403 (2011) https://doi.org/10.1117/12.892836

KEYWORDS: Particles, Silicon, Quantum dot light emitting diodes, Transmission electron microscopy, Etching, Crystals, Quantum dots, X-ray diffraction, Plasma, Atmospheric particles

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Proceedings Article | 21 August 2009 Paper

Defects in amorphous silicon carbide and their relation to solar cell device performance

Brian Simonds, Feng Zhu, Jian Hu, Arun Madan, P. Craig Taylor

Proceedings Volume 7409, 740912 (2009) https://doi.org/10.1117/12.826451

KEYWORDS: Carbon, Solar cells, Amorphous silicon, Silicon, Signal detection, Quantum efficiency, Silicon films, Silicon carbide, Methane, Spectroscopy

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Showing 5 of 11 publications

Conference Committee Involvement (6)

Dimensional Optical Metrology and Inspection for Practical Applications XIII

24 April 2024 | National Harbor, Maryland, United States

Dimensional Optical Metrology and Inspection for Practical Applications XII

2 May 2023 | Orlando, Florida, United States

Dimensional Optical Metrology and Inspection for Practical Applications XI

5 April 2022 | Orlando, Florida, United States

Dimensional Optical Metrology and Inspection for Practical Applications X

12 April 2021 | Online Only, Florida, United States

Dimensional Optical Metrology and Inspection for Practical Applications IX

27 April 2020 | Online Only, California, United States

Showing 5 of 6 Conference Committees

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