Dr. Dionisio Bernal
Associate Professor at Northeastern Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2009 Paper
Proceedings Volume 7295, 729521 (2009) https://doi.org/10.1117/12.816211
KEYWORDS: Inspection, Autoregressive models, Damage detection, Bridges, Data modeling, Nano opto mechanical systems, Interference (communication), Matrices, Copper, Signal to noise ratio

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