Dr. Dong Si Profile

Dr. Dong Si

at Univ of Washington Bothell

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Publications (1)

Proceedings Article | 1 March 2019 Paper

Comparison of deep learning approaches to low dose CT using low intensity and sparse view data

Thomas Humphries, Dong Si, Sean Coulter, Matthew Simms, Ruiwen Xing

Proceedings Volume 10948, 109484A (2019) https://doi.org/10.1117/12.2512597

KEYWORDS: Image quality, Computed tomography, Denoising, Image filtering, Data corrections, Network architectures, Signal attenuation, X-ray computed tomography, Convolutional neural networks

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