In the semiconductor manufacturing process, it is important to predict defective chips in advance for reduction of test cost and early stabilization of the production process. However, highly imbalanced datasets in the semiconductor test process degrade the performance of prediction. In order to enhance an SVM Ensemble, this study presents an improved methodology using the K-means, which clusters the majority class and the minority class before training an SVM. A result of the experiment with the actual data of the semiconductor test process is reported to demonstrate that our approach outperforms other methods in terms of classifying the imbalanced dataset.
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