Dr. Eun-mi Park
at Sungkyunkwan University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 December 2013 Paper
Eun-mi Park, Jee-Hyong Lee
Proceedings Volume 9067, 90672D (2013) https://doi.org/10.1117/12.2052973
KEYWORDS: Semiconductors, Semiconducting wafers, Wafer testing, Binary data, Communication engineering, Semiconductor manufacturing, Fuzzy logic, Data modeling, Electronics, Data mining

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