Dr. Eric Ziegler Profile

Dr. Eric Ziegler

Physicist at ESRF - The European Synchrotron

SPIE Involvement:

Author

Publications (40)

Proceedings Article | 24 May 2017 Paper

Development of a hard x-ray wavefront sensor for the EuXFEL

Sebastien Berujon, Eric Ziegler, Ruxandra Cojocaru, Thierry Martin

Proceedings Volume 10237, 102370K (2017) https://doi.org/10.1117/12.2269452

KEYWORDS: Sensors, Cameras, Distortion, Scintillators, Wavefront sensors, X-rays, Free electron lasers, Hard x-rays, Diagnostics, Wavefronts, Speckle, Metrology, Synchrotrons

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Proceedings Article | 27 August 2010 Paper

Micro-imaging performance of multilayers used as monochromators for coherent hard x-ray synchrotron radiation

A. Rack, T. Weitkamp, M. Riotte, T. Rack, R. Dietsch, T. Holz, M. Krämer, F. Siewert, M. Meduna, Ch. Morawe, P. Cloetens, E. Ziegler

Proceedings Volume 7802, 78020M (2010) https://doi.org/10.1117/12.858355

KEYWORDS: Monochromators, Multilayers, Light sources, Hard x-rays, Photons, Mirrors, X-ray imaging, Synchrotron radiation, Crystals, Coating

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Proceedings Article | 13 June 2006 Paper

Multi-layer coating development for XEUS

D. Lumb, M. Bavdaz, F. Christensen, A. Dariel, P. Hoghoj, C. Jensen, M. Krumrey, K. Madsen, E. Ziegler, B. Albertin, S. Hedacq, M. Collon, E.-J. Buis

Proceedings Volume 6266, 626614 (2006) https://doi.org/10.1117/12.669946

KEYWORDS: Coating, Reflectivity, Multilayers, Silicon, Mirrors, X-rays, Space telescopes, Interfaces, X-ray telescopes, Telescopes

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Proceedings Article | 31 August 2005 Paper

In situ study of multilayer reflectivity upon heat treatment under synchrotron radiation

Christine Borel, Christian Morawe, Eric Ziegler, Thierry Bigault, Jean-Yves Massonnat, Jean-Christophe Peffen, Emilie Debourg

Proceedings Volume 5918, 591801 (2005) https://doi.org/10.1117/12.613873

KEYWORDS: Reflectivity, Annealing, Multilayers, Heat treatments, Data modeling, Synchrotron radiation, Ruthenium, X-rays, Synchrotrons, Interfaces

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Proceedings Article | 3 November 2004 Paper

Application of double-gradient multilayers for focusing

Christian Morawe, Christine Borel, Eric Ziegler, Jean-Christophe Peffen

Proceedings Volume 5537, (2004) https://doi.org/10.1117/12.555912

KEYWORDS: Mirrors, Multilayers, Reflectivity, Solids, X-rays, Synchrotrons, Reflection, Data centers, Ruthenium, X-ray optics

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Proceedings Article | 26 October 2004 Paper

Tomographic x-ray absorption spectroscopy

Christian Schroer, Marion Kuhlmann, Til Florian Gunzler, Bruno Lengeler, Matthias Richwin, Bernd Griesebock, Dirk Lutzenkirchen-Hecht, Ronald Frahm, Eric Ziegler, Ali Mashayekhi, Dean Haeffner, Jan-Dierk Grunwaldt, Alfons Baiker

Proceedings Volume 5535, (2004) https://doi.org/10.1117/12.559706

KEYWORDS: Tomography, X-rays, Copper, Absorption, Absorption spectroscopy, Chemical elements, Luminescence, Capillaries, Monochromators, Data acquisition

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Proceedings Article | 18 October 2004 Paper

Moiré interferometry formulas for hard x-ray wavefront sensing

Timm Weitkamp, A. Diaz, Bernd Nohammer, Franz Pfeiffer, Marco Stampanoni, Eric Ziegler, Christian David

Proceedings Volume 5533, (2004) https://doi.org/10.1117/12.559695

KEYWORDS: Wavefronts, Absorption, Fringe analysis, Sensors, Hard x-rays, Wavefront sensors, Deflectometry, Interferometers, X-rays, Wavefront distortions

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Proceedings Article | 11 October 2004 Paper

Hard x-ray optics: from HEFT to NuSTAR

Jason Koglin, C. M. Chen, Jim Chonko, Finn Christensen, William Craig, Todd Decker, Charles Hailey, Fiona Harrison, Carsten Jensen, Kristin Madsen, Michael Pivovaroff, Marcela Stern, David Windt, Eric Ziegler

Proceedings Volume 5488, (2004) https://doi.org/10.1117/12.552470

KEYWORDS: Glasses, Telescopes, Space telescopes, X-rays, Mirrors, X-ray optics, Multilayers, Prototyping, Optics manufacturing, Reflectivity

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Proceedings Article | 29 January 2004 Paper

Optical constants for hard x-ray multilayers over the energy range E = 35 – 180 keV

David Windt, Soizik Donguy, Charles Hailey, Jason Koglin, Veijo Honkimaki, Eric Ziegler, Finn Christensen, Fiona Harrison

Proceedings Volume 5168, (2004) https://doi.org/10.1117/12.505886

KEYWORDS: Multilayers, Reflectivity, Silicon carbide, Hard x-rays, Silicon, Scattering, Mirrors, Platinum, Lawrencium, Optical coatings

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Proceedings Article | 29 January 2004 Paper

Production and calibration of the first HEFT hard x-ray optics module

Jason Koglin, C. M. Chen, James Chonko, Finn Christensen, William Craig, Todd Decker, Kurt Gunderson, Charles Hailey, Fiona Harrison, Carsten Jensen, Kristin Madsen, Marcela Stern, David Windt, Haitao Yu, Eric Ziegler

Proceedings Volume 5168, (2004) https://doi.org/10.1117/12.506431

KEYWORDS: X-rays, Space telescopes, Glasses, X-ray optics, Telescopes, Mirrors, Hard x-rays, Metrology, X-ray telescopes, Satellites

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Proceedings Article | 29 January 2004 Paper

X-ray study of W/Si multilayers for the HEFT hard x-ray telescope

Kristin Madsen, Finn Christensen, Carsten Jensen, Eric Ziegler, William Craig, Kurt Gunderson, Jason Koglin, K. Pedersen

Proceedings Volume 5168, (2004) https://doi.org/10.1117/12.505665

KEYWORDS: Mirrors, Reflectivity, Coating, Space telescopes, X-ray telescopes, X-rays, Multilayers, Scattering, Sensors, Telescopes

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Proceedings Article | 23 December 2003 Paper

Double multilayer monochromator to tailor bending magnet radiation spectrum

Thierry Bigault, Eric Ziegler, Christian Morawe, Robert Hustache, Jean-Yves Massonnat, Gerard Rostaing

Proceedings Volume 5195, (2003) https://doi.org/10.1117/12.515980

KEYWORDS: Monochromators, Crystals, Laser crystals, Reflectivity, Silicon, Absorption, Sensors, Ruthenium, Synchrotron radiation, Photonic crystals

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Proceedings Article | 11 March 2003 Paper

Coating of the HEFT telescope mirrors: method and results

Carsten Jensen, Kristin Madsen, Hubert Chen, Finn Christensen, Eric Ziegler

Proceedings Volume 4851, (2003) https://doi.org/10.1117/12.461315

KEYWORDS: Coating, Mirrors, Silicon, Argon, Space telescopes, Telescopes, X-rays, Hard x-rays, Protactinium, Reflectivity

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Proceedings Article | 11 March 2003 Paper

W/SiC x-ray multilayers optimized for use above 100 keV

David Windt, Soizik Donguy, Charles Hailey, Jason Koglin, Veijo Honkimaki, Eric Ziegler, Finn Christensen, C. M. Hubert Chen, Fiona Harrison, William Craig

Proceedings Volume 4851, (2003) https://doi.org/10.1117/12.461303

KEYWORDS: Reflectivity, Multilayers, Interfaces, X-rays, Hard x-rays, Silicon carbide, Grazing incidence, Scattering, Synchrotron radiation, X-ray telescopes

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Proceedings Article | 24 December 2002 Paper

Wideband multilayer mirrors for medium to hard x-ray applications

Eric Ziegler, Christian Morawe, Igor Kozhevnikov, T. Bigault, Claudio Ferrero, A. Tallandier

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.455690

KEYWORDS: Reflectivity, Mirrors, Multilayers, X-rays, Synchrotrons, Hard x-rays, X-ray optics, Astrophysics, Crystals, Optics manufacturing

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Proceedings Article | 30 January 2002 Paper

Multilayer coating facility for the HEFT hard x-ray telescope

Carsten Jensen, Finn Christensen, Hubert Chen, Erik Smitt, Eric Ziegler

Proceedings Volume 4496, (2002) https://doi.org/10.1117/12.454368

KEYWORDS: Coating, Mirrors, Space telescopes, Multilayers, Hard x-rays, X-ray telescopes, Segmented mirrors, Calibration, X-rays, Telescopes

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Proceedings Article | 13 December 2001 Paper

Tunable diffractive optical elements for hard x-rays

Christian David, Bernd Noehammer, Eric Ziegler, Olivier Hignette

Proceedings Volume 4499, (2001) https://doi.org/10.1117/12.450226

KEYWORDS: Diffraction, Lenses, Zone plates, Wet etching, Silicon, Hard x-rays, Etching, Synchrotrons, X-rays, Fabrication

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Proceedings Article | 10 December 2001 Paper

X-ray study of surfaces and interfaces

Victor Asadchikov, Inna Bukreeva, Angela Duparre, Igor Kozhevnikov, Yury Krivonosov, Christian Morawe, Mikhail Pyatakhin, Joerg Steinert, Alexander Vinogradov, Eric Ziegler

Proceedings Volume 4449, (2001) https://doi.org/10.1117/12.450102

KEYWORDS: Reflectivity, X-rays, Scattering, Multilayers, Inverse problems, Interfaces, Spatial frequencies, Atomic force microscopy, Silicon, Mirrors

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Proceedings Article | 14 November 2001 Paper

High-resolution Al203/B4C multilayers

Christian Morawe, Jean-Christophe Peffen, Eric Ziegler, Andreas Freund

Proceedings Volume 4501, (2001) https://doi.org/10.1117/12.448485

KEYWORDS: Silicon, Crystals, Multilayers, Aluminum, Reflectivity, X-rays, Scattering, Spectral resolution, X-ray optics, Laser crystals

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Proceedings Article | 5 January 2001 Paper

High-resolution micropore x-ray optics produced with microchannel plate technology

Marco Beijersbergen, Marcos Bavdaz, Anthony Peacock, Enrico Tomaselli, R. Fairbend, J.-P. Boutot, Sven Flyckt, A. Brunton, G. Price, George Fraser, C. Herrmann, Michael Krumrey, Eric Ziegler, Andreas Freund

Proceedings Volume 4145, (2001) https://doi.org/10.1117/12.411636

KEYWORDS: X-ray optics, Optical fibers, X-rays, Image quality, Reflection, Glasses, X-ray telescopes, Surface roughness, Prototyping, X-ray astronomy

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Proceedings Article | 5 January 2001 Paper

High-resolution multilayer x-ray optics

Christian Morawe, Jean-Christophe Peffen, Eric Ziegler, Andreas Freund

Proceedings Volume 4145, (2001) https://doi.org/10.1117/12.411658

KEYWORDS: Multilayers, Reflectivity, Spectral resolution, X-ray optics, X-rays, Coating, Interfaces, Information operations, Monochromators, Deposition processes

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Proceedings Article | 2 November 2000 Paper

X-ray study of the roughness of surfaces and interfaces

Igor Kozhevnikov, Victor Asadchikov, Inna Bukreeva, Angela Duparre, Yury Krivonosov, Christian Morawe, Vladimir Ostashev, Mikhail Pyatakhin, Eric Ziegler

Proceedings Volume 4099, (2000) https://doi.org/10.1117/12.405809

KEYWORDS: Scattering, X-rays, Interfaces, Laser scattering, Polishing, Atomic force microscopy, Multilayers, Spatial frequencies, Mirrors, Surface roughness

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Proceedings Article | 18 July 2000 Paper

Novel micropore x-ray optics produced with microchannel plate technology

Marco Beijersbergen, Marcos Bavdaz, Anthony Peacock, Enrico Tomaselli, George Fraser, Adam Brunton, G. Price, Michael Krumrey, Clemens Herrmann, Andreas Freund, Eric Ziegler, Alexei Souvorov, R. Fairbend, J.-P. Boutot, Sven Flyckt

Proceedings Volume 4012, (2000) https://doi.org/10.1117/12.391557

KEYWORDS: X-ray optics, Optical fibers, X-rays, Glasses, Image quality, Surface roughness, Microchannel plates, Spatial resolution, Cladding, Polishing

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Proceedings Article | 18 July 2000 Paper

Hard x-ray characterization of a HEFT single-reflection prototype

Finn Christensen, William Craig, Charles Hailey, Mario Jimenez-Garate, David Windt, Fiona Harrison, Peter Mao, Eric Ziegler, Veijo Honkimaki, Manuel Sanchez del Rio, Andreas Freund, M. Ohler

Proceedings Volume 4012, (2000) https://doi.org/10.1117/12.391602

KEYWORDS: Reflectivity, Mirrors, Data modeling, Space telescopes, X-ray telescopes, Multilayers, Hard x-rays, Prototyping, X-rays, Reflection

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Proceedings Article | 16 November 1999 Paper

Design and performance of graded multilayers

Christian Morawe, Jean-Christophe Peffen, Olivier Hignette, Eric Ziegler

Proceedings Volume 3773, (1999) https://doi.org/10.1117/12.370083

KEYWORDS: Mirrors, Multilayers, Reflectivity, X-rays, Crystals, Monochromators, Solids, Sputter deposition, Silicon, Ions

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Proceedings Article | 27 August 1999 Paper

Depth-graded multilayer mirrors for the hard x-ray spectral region: theory and inverse and direct problems

Eric Ziegler, Inna Bukreeva, Igor Kozhevnikov, Alexandr Pirozhkov, Eugene Ragozin

Proceedings Volume 3737, (1999) https://doi.org/10.1117/12.360033

KEYWORDS: Reflectivity, Mirrors, Multilayers, X-rays, Hard x-rays, Inverse problems, Absorption, Interfaces, X-ray telescopes, Dielectrics

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Proceedings Article | 11 December 1998 Paper

Theoretical study of multilayer x-ray mirrors with a wide spectral band of reflection

Igor Kozhevnikov, Inna Bukreeva, Eric Ziegler

Proceedings Volume 3448, (1998) https://doi.org/10.1117/12.332520

KEYWORDS: Reflectivity, Mirrors, Multilayers, X-rays, Inverse problems, X-ray optics, Inverse optics, Dielectrics, Hard x-rays, Interfaces

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Proceedings Article | 22 November 1996 Paper

X-ray focusing using elliptically bent multilayers

Eric Ziegler, Olivier Hignette, Manohar Lingham, Alexei Souvorov

Proceedings Volume 2856, (1996) https://doi.org/10.1117/12.259850

KEYWORDS: Mirrors, X-rays, Multilayers, Synchrotrons, Silicon, Crystals, Distortion, Cameras, Optical components, Monochromators

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Proceedings Article | 16 August 1996 Paper

In-situ growth control of x-ray multilayers using visible light kinetic ellipsometry and grazing incidence x-ray reflectometry

Eike Luken, Eric Ziegler, Manohar Lingham

Proceedings Volume 2873, (1996) https://doi.org/10.1117/12.246194

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Proceedings Article | 19 July 1996 Paper

Double multilayer monochromator for harmonic rejection in the 5-to60-keV range

Manohar Lingham, Eric Ziegler, Eike Luken, Paul Loeffen, Stefan Muellender, Jose Goulon

Proceedings Volume 2805, (1996) https://doi.org/10.1117/12.245090

KEYWORDS: Multilayers, Monochromators, Reflectivity, X-rays, Crystals, Tungsten, Mirrors, Silicon, Synchrotron radiation, Absorption

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SPIE Journal Paper | 1 February 1995

Multilayers for high heat load synchrotron applications

Eric Ziegler

OE, Vol. 34, Issue 02, (February 1995) https://doi.org/10.1117/12.10.1117/12.194837

KEYWORDS: X-rays, Reflectivity, Multilayers, Crystals, Mirrors, Silicon, Annealing, Monochromators, Molybdenum, Synchrotrons

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Proceedings Article | 7 November 1994 Paper

Prospects for supermirrors in hard x-ray spectroscopy

Karsten Joensen, Paul Gorenstein, Finn Christensen, Peter Hoghoj, Eric Ziegler, Jean Susini, Andreas Freund, D. Siddons, James Wood

Proceedings Volume 2283, (1994) https://doi.org/10.1117/12.193181

KEYWORDS: Reflectivity, Hard x-rays, X-rays, Multilayers, Absorption, X-ray optics, X-ray telescopes, Interfaces, Reflection, Synchrotrons

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Proceedings Article | 4 November 1994 Paper

In situ growth studies of nanometer thin-film multilayers using grazing x-ray reflectivity and ellipsometry

Eike Lueken, Eric Ziegler, P. Hoeghoej, Andreas Freund, Erich Gerdau, Alain Fontaine

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192085

KEYWORDS: X-rays, Reflectivity, Ellipsometry, Scattering, Deposition processes, Thin films, Multilayers, Reflectometry, Grazing incidence, Spectroscopic ellipsometry

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Proceedings Article | 4 November 1994 Paper

Multilayer supermirrors: broad-band reflection coatings for the 15 to 100 keV range

Karsten Joensen, Paul Gorenstein, Finn Christensen, P. Hoeghoej, Eric Ziegler, Jean Susini, Andreas Freund, James Wood

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192082

KEYWORDS: Reflectivity, Multilayers, Hard x-rays, Absorption, X-rays, Optical coatings, Interfaces, Synchrotrons, Astrophysics, Reflection

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Proceedings Article | 4 November 1994 Paper

Multilayer optics for synchrotron x-ray applications

Eric Ziegler

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192076

KEYWORDS: Multilayers, X-rays, Reflectivity, Synchrotrons, X-ray optics, Mirrors, Crystals, Synchrotron radiation, Monochromators, Optical engineering

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Proceedings Article | 4 November 1994 Paper

Multilayer coatings for x-ray optics made by distributed electron cyclotron resonance (DECR) plasma sputtering

Peter Hoghoj, Eric Ziegler, Eike Lueken, Jean-Christophe Peffen, Andreas Freund

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192080

KEYWORDS: Plasma, Silicon, Sputter deposition, Multilayers, Argon, Microwave radiation, X-ray optics, Antennas, Reflectivity, X-rays

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Proceedings Article | 1 February 1994 Paper

Multilayered supermirror structures for hard x-ray synchrotron and astrophysics instrumentation

Karsten Joensen, Peter Hoghoj, Finn Christensen, Paul Gorenstein, Jean Susini, Eric Ziegler, Andreas Freund, James Wood

Proceedings Volume 2011, (1994) https://doi.org/10.1117/12.167210

KEYWORDS: Reflectivity, Multilayers, Coating, Hard x-rays, X-rays, Reflectors, Absorption, Synchrotrons, Reflection, X-ray optics

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Proceedings Article | 1 February 1994 Paper

Measurement of multilayer reflectivities from 8 keV to 130 keV

Peter Hoghoj, Karsten Joensen, Finn Christensen, Jean Susini, Eric Ziegler, Andreas Freund, E. Lueken, Christian Riekel

Proceedings Volume 2011, (1994) https://doi.org/10.1117/12.167237

KEYWORDS: Reflectivity, Multilayers, X-rays, Sensors, Germanium, Silicon, Optical simulations, Monochromators, Scattering, Data modeling

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Proceedings Article | 1 January 1992 Paper

Experimental study of Fe/C multilayer performance: effects of substrate quality and of x-ray irradiation

Eric Ziegler, M. Krisch, L. Vasquez, Jean Susini, Pierre Boher, Philippe Houdy

Proceedings Volume 1547, (1992) https://doi.org/10.1117/12.51286

KEYWORDS: Multilayers, X-rays, Scanning tunneling microscopy, X-ray optics, Reflectivity, Synchrotrons, Iron, Coating, Carbon, Silicon

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SPIE Journal Paper | 1 August 1990

X-ray mirrors for the European Synchrotron Radiation Facility

Andreas Freund, Francois de Bergevin, Gerard Marot, Christian Riekel, Jean Susini, Lin Zhang, Eric Ziegler

OE, Vol. 29, Issue 08, (August 1990) https://doi.org/10.1117/12.10.1117/12.55678

KEYWORDS: Mirrors, Scattering, X-rays, Synchrotron radiation, Laser scattering, Reflectivity, X-ray optics, Optical components, Monochromators, Silicon carbide

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Showing 5 of 40 publications

Conference Committee Involvement (2)

Optical Constants of Materials for UV to X-Ray Wavelengths

4 August 2004 | Denver, Colorado, United States

Crystals, Multilayers, and Other Synchrotron Optics

5 August 2003 | San Diego, California, United States

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