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Erik Lenferink
at Block Engineering LLC
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Author
Publications (4)
Proceedings Article | 7 June 2024 Presentation + Paper
High-speed single-pixel long-wave-infrared trace chemical detection system
Thomas Gray, Derek Wood, Dimitry Maltsev, Wynn Bowers, Anish Goyal, Erik Lenferink, Charles Meeske, Steve Korbly
Proceedings Volume 13056, 130560Y (2024) https://doi.org/10.1117/12.3013315
KEYWORDS: Mercury cadmium telluride, Quantum cascade lasers, Sensors, Signal to noise ratio, Reflectivity, Long wavelength infrared, Spectral resolution
Proceedings Article | 7 June 2024 Presentation + Paper
Hand-portable trace chemical detector
Erik Lenferink, Anish Goyal, Dimitry Maltsev, Wynn Bowers, Paul Kafig, Thomas Gray, Derek Wood, Charles Meeske, Steve Korbly
Proceedings Volume 13056, 130560F (2024) https://doi.org/10.1117/12.3013313
KEYWORDS: Contamination, Sensors, Long wavelength infrared, Quantum cascade lasers, Signal to noise ratio, Reflectivity, Image segmentation, Speckle, Chemical detection, Cameras
Proceedings Article | 14 June 2023 Presentation + Paper
Low-cost trace chemical detection system
Erik Lenferink, Anish Goyal, Derek Wood, Dimitry Maltsev, Wynn Bowers, Thomas Gray, Charles Meeske, Steve Korbly
Proceedings Volume 12541, 125410H (2023) https://doi.org/10.1117/12.2663487
KEYWORDS: Microbolometers, Reflectivity, Imaging systems, Mercury cadmium telluride, Cameras, Quantum cascade lasers, Long wavelength infrared, Hyperspectral imaging, Glasses, Chemical detection
Proceedings Article | 18 February 2020 Presentation + Paper
Valley-selective optical Stark effect of exciton-polaritons in a monolayer semiconductor
Proceedings Volume 11282, 112820D (2020) https://doi.org/10.1117/12.2546644
KEYWORDS: Polaritons, Excitons, Reflectivity, Data modeling, Semiconductors, Magnetism, Polarization, Photon polarization, Physics
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