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Filippo Zamperetti
at Univ degli Studi di Padova
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Publications (1)
Proceedings Article | 16 February 2020 Paper
Degradation and recovery of high-periodicity InGaN/GaN MQWs under optical stress in short-circuit condition
Proceedings Volume 11280, 112800E (2020) https://doi.org/10.1117/12.2547590
KEYWORDS: External quantum efficiency, Quantum efficiency, Solar cells, Quantum wells, Reliability, Wafer-level optics, Resistance, Gallium nitride, Silicon
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