Frank W. Mont
at Rensselaer Polytechnic Institute
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 February 2007 Paper
Frank Mont, Jong Kyu Kim, Martin Schubert, Hong Luo, E. Fred Schubert, Richard Siegel
Proceedings Volume 6486, 64861C (2007) https://doi.org/10.1117/12.723305
KEYWORDS: Nanoparticles, Epoxies, Refractive index, Scattering, Light emitting diodes, Transmittance, Rayleigh scattering, Silicon, Gallium nitride, Reflection

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