Prof. Gaofa He
at Chongqing Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 October 2013 Paper
Gaofa He, Zhigang Jia, So Ito, Yuki Shimizu, Wei Gao
Proceedings Volume 8916, 891610 (2013) https://doi.org/10.1117/12.2035716
KEYWORDS: Electrodes, Scanners, Finite element methods, Microscopy, Prototyping, Resonators, Dielectrics, Dielectric polarization, Scanning probe microscopy, Atomic force microscopy

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