Gregory J. Dick
Senior Member of Technical Staff
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 March 2018 Presentation + Paper
Proceedings Volume 10588, 1058806 (2018) https://doi.org/10.1117/12.2297400
KEYWORDS: Optical proximity correction, Genetic algorithms, Optimization (mathematics), Photomasks, Data processing

Proceedings Article | 5 May 2005 Paper
James Bruce, Edward Conrad, Gregory Dick, D. John Nickel, Jacek Smolinski
Proceedings Volume 5756, (2005) https://doi.org/10.1117/12.600552
KEYWORDS: Optical proximity correction, Lithography, Photomasks, Manufacturing, Data modeling, Semiconducting wafers, Model-based design, Data archive systems, Error analysis, Reticles

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