CONFERENCE PROCEEDINGS
Advanced Search
Dr. Hui-Lin Hsu
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 28 August 2010 Paper
Temperature-dependent structural characterization of silicon <110> nanowires
Min-Ki Kwon, Ja-Yeon Kim, Logeeswaran J., Yi-Ju Teng, Hui-Lin Hsu, Patricia Abellán Baeza, Ilke Arslan, M. Saif Islam
Proceedings Volume 7768, 77680H (2010) https://doi.org/10.1117/12.861606
KEYWORDS: Silicon, Gold, Field effect transistors, Chemical vapor deposition, Transmission electron microscopy, Thin films, Oxides, Annealing, Scanning electron microscopy, Nanowires
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top