This will count as one of your downloads.
You will have access to both the presentation and article (if available).
We developed an interferometric coating based on an MgF2/LaF3 multilayer stack deposited by ion-assisted electron-beam deposition. We gradually improved our evaporation setup to reach a high degree of homogeneity, precision and repeatability on the material thicknesses, over the entire mirrors surface. The reflectivity maximum is above 85% and the wavelength at which it occurs is adjustable within 1 nm, while the out-of-band reflectivity between 120 and 155 nm and between 200 nm and 1100 nm is kept below 6% on average never exceeding 8 %.
The coating has been space qualified and shows stable performances in conditions representative of the instrument operation environment (thermal cycling under vacuum, radiations, UV exposure…).
Development of digital holography in the long wave infrared range for assessment of space reflectors
A long-wave infrared digital holographic interferometer for the verification and validation of this type of reflector in a space environment is presented. It has been developed to fill the gap between holography/interferometry techniques in the visible wavelengths and methods based on structured light illumination like videogrammetry, stereocorrelation, and fringe/pattern projection. The former provide a good measurement uncertainty but the displacements are often too large to be measured and they require a very stable environment, while the latter provide large measurement range but with higher measurement uncertainty.
The new instrument is based on digital holography and uses a CO2 lasers emitting at 10.6μm combined with a commercial thermographic camera. A diffuser is illuminated by the laser beam, producing a speckle wavefront which is observed after reflection on the reflector surface. This reflected speckle wavefront behaves exactly as if the reflector was a diffusive surface, producing its own speckle, allowing the measurement of its deformation. The advantage of this configuration compared to a classical interferometer working at 10.6μm, is that it requires no specific optics such as a null lens (in the case of parabola) or expensive illumination/collection optics (in the case of ellipse).
The metrological certification of the system was performed in the laboratory by measuring the tilts of a 1.1 meter diameter parabolic reflector. The displacements are measured in parallel with a Doppler effect interferometer and the measurement uncertainty is estimated. The technique has been certified during a thermal-vacuum test. The deformation of the parabolic reflector is measured for a temperature variation from 288 K down to 113 K. The results are compared to previous results obtained on the same reflector with a high spatial resolution infrared interferometer, also developed at CSL.
View contact details
No SPIE Account? Create one
