Dr. Jeeeon Kim
at ASML
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 21 August 2023 Open Access
JM3, Vol. 22, Issue 03, 034201, (August 2023) https://doi.org/10.1117/12.10.1117/1.JMM.22.3.034201
KEYWORDS: Image restoration, Metrology, Scanning electron microscopy, Image processing, Image quality, Neural networks, Education and training, Tunable filters, Machine learning, Line edge roughness

Proceedings Article | 26 May 2022 Presentation + Paper
Proceedings Volume 12053, 1205309 (2022) https://doi.org/10.1117/12.2614281
KEYWORDS: Convolutional neural networks, Computer vision technology, Machine learning, Image restoration, Image quality, Metrology, Scanning electron microscopy, Image processing, Image enhancement, Denoising, Neural networks, Data modeling, Time metrology

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